Simultaneous measurement of six layers in a silicon on insulator film stack using spectrophotometry and beam profile reflectometry

نویسندگان

  • J. M. Leng
  • J. J. Sidorowich
  • Y. D. Yoon
  • J. Opsal
  • B. H. Lee
  • G. Cha
  • J. Moon
  • S. I. Lee
چکیده

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تاریخ انتشار 2012